DocumentCode
3710813
Title
Pressure sensors based on high frequency operating GaN FBARs
Author
Ioana Giangu;George Stavrinidis;Alexandra Stefanescu;Antonis Stavrinidis;Adrian Dinescu;George Konstantinidis;Alexandru M?ller
Author_Institution
IMT-Bucharest, 32B, (126A) Erou Iancu Nicolae street, 077190, Romania
fYear
2015
Firstpage
99
Lastpage
102
Abstract
In this paper, first experiments regarding characterization of the GaN based FBAR (Film Bulk Acoustic Resonator) structures as pressure sensors are presented. The FBAR structures have been manufactured on GaN/Si using advanced micromachining technologies. The experiments have demonstrated the excellent mechanical properties of 0.5 μm thin GaN membranes able to support a pressure of at least 5 Bar.
Keywords
"Film bulk acoustic resonators","Resonant frequency","Gallium nitride","Temperature sensors","Pressure sensors","Temperature measurement","Silicon"
Publisher
ieee
Conference_Titel
Semiconductor Conference (CAS), 2015 International
ISSN
1545-827X
Print_ISBN
978-1-4799-8862-4
Type
conf
DOI
10.1109/SMICND.2015.7355174
Filename
7355174
Link To Document