DocumentCode
3710852
Title
On the models used for TCAD simulations of Diamond Schottky Barrier Diodes
Author
N. Donato;M. Antoniou;E. Napoli;G. Amaratunga;F. Udrea
Author_Institution
Engineering Department, University of Cambridge, CB2 1PZ, UK
fYear
2015
Firstpage
223
Lastpage
226
Abstract
In this paper we present a numerical analysis of Schottky Barrier Diodes (SBDs) based on CVD (Chemical Vapour Deposition) Diamond. Material and interface models suitable for TCAD (Technology Computer Aided Design) finite element simulations were implemented in the software and their validity was assessed against experimental results obtained on MIP+(Metal-Intrinsic layer-highly P doped substrate) SBDs with Al and Au as Schottky metal contacts both at room and higher temperature conditions. The paper also highlights the need to improve such TCAD models since the complex behavior of Diamond based devices is still not well captured in static and dynamic conditions. The present work also discusses the role of the Oxygen surface interface in the on state performances of the SBDs.
Keywords
"Diamonds","Semiconductor process modeling","Temperature dependence","Fitting","Numerical models","Substrates","Mathematical model"
Publisher
ieee
Conference_Titel
Semiconductor Conference (CAS), 2015 International
ISSN
1545-827X
Print_ISBN
978-1-4799-8862-4
Type
conf
DOI
10.1109/SMICND.2015.7355214
Filename
7355214
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