Title :
Predicting service life of bypass diodes in photovoltaic modules
Author :
Narendra Shiradkar;Vivek Gade;Kalpathy Sundaram
Author_Institution :
Florida Solar Energy Center, University of Central Florida, 1679 Clearlake Road, Cocoa, 32922, USA
fDate :
6/1/2015 12:00:00 AM
Abstract :
Service life model for bypass diodes is a critical step towards developing service life models for PV modules. A review of failure mechanisms in bypass diodes along with the accelerated tests that could replicate them is presented. Susceptibility of commercially available bypass diodes for thermal runaway was studied. Accelerated tests were performed to study the diode wear out by High Temperature Forward Bias (HTFB) and Thermal Cycling (TC) mechanisms.
Keywords :
"Schottky diodes","Failure analysis","Temperature measurement","Silicon","Degradation","Acceleration"
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
DOI :
10.1109/PVSC.2015.7355606
