• DocumentCode
    3711010
  • Title

    Au nanocluster and PEDOT: PSS blend in the electrical performance of hybrid silicon solar cell

  • Author

    Manisha Sharma;Arturo A Ayon

  • Author_Institution
    The MEMS Research Laboratory, The University of Texas at San Antonio, One UTSA Circle, 78249, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Poly( 3,4-ethyllenedioxythiophene):poly (styrene sulfonate) (PEDOT:PSS), a P-type organic polymer is frequently employed in the fabrication of heterojuction p-n solar cell devices due to its proper HOMO-LUMO band gap as well as its tunable conductivity. Addition of small volume percentage of organic additives such as dimethyl sulfoxide (DMSO) has a positive effect on the conductivity of this polymer. In this report we describe the incorporation of gold (Au) nanocluster in the PEDOT: PSS and the effect of this blend on the power-conversion efficiency (PCE) on planer silicon (Si) hybrid heterojunction solar cell devices. Specifically, the reference sample without the aforementioned nanocluster were measured to exhibit a 6.10 % PCE value that increase to 7.55% upon the addition of the Au nanocluster. The observed increase in the PCE is attributed to the enhanced electrical conductivity of the PEDOT: PSS film due to the incorporation of the nanocluster, which is directly reflected in their improved fill factor. It is further theorized that presence of Au nanocluster in the insulating PSS layer in the PEDOT: PSS blend have a positive influence in the charge collection effectiveness of the devices produced. Considering that the Au nanoparticles involved in this research exercise had an average size of only 4nm, it is consider that plasmonic effect did not play a relevant role in the observed PCE improvement.
  • Keywords
    "Nanoscale devices","Gold","Performance evaluation","Conductivity","Films","Rough surfaces","Surface roughness"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7355726
  • Filename
    7355726