• DocumentCode
    3711015
  • Title

    Capacitance effect from high to low level lighting by Real-Time One-Sweep Method for OPV device

  • Author

    Yean-San Long;Shu-Tsung Hsu;Teng-Chun Wu

  • Author_Institution
    Center for Measurement Standards, Industrial Technology Research Institute, Rm.213, Bldg.3, No. 321, Kuang Fu Road, Sec. 2, Hsinchu 30011, TAIWAN
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    To accurate characterization of DSC requires different level lighting consideration on each very slow temporal response. In addition to OPV characteristics requires additional considering the forward/backward sweep in I-V curves, but the related features in measuring I-V curves are more sensitive to temperature due to non-linear issue. Good accuracy data showed measurement shall be real time removing capacitance effect with a Real-Time One-Sweep Method (RTOSM), which is useful to measuring cell more accurately and rapidly when evaluating performance.
  • Keywords
    "Area measurement","Delays","Real-time systems","Sun"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7355731
  • Filename
    7355731