DocumentCode
3711015
Title
Capacitance effect from high to low level lighting by Real-Time One-Sweep Method for OPV device
Author
Yean-San Long;Shu-Tsung Hsu;Teng-Chun Wu
Author_Institution
Center for Measurement Standards, Industrial Technology Research Institute, Rm.213, Bldg.3, No. 321, Kuang Fu Road, Sec. 2, Hsinchu 30011, TAIWAN
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
1
Lastpage
3
Abstract
To accurate characterization of DSC requires different level lighting consideration on each very slow temporal response. In addition to OPV characteristics requires additional considering the forward/backward sweep in I-V curves, but the related features in measuring I-V curves are more sensitive to temperature due to non-linear issue. Good accuracy data showed measurement shall be real time removing capacitance effect with a Real-Time One-Sweep Method (RTOSM), which is useful to measuring cell more accurately and rapidly when evaluating performance.
Keywords
"Area measurement","Delays","Real-time systems","Sun"
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type
conf
DOI
10.1109/PVSC.2015.7355731
Filename
7355731
Link To Document