Title :
On the reliability of photovoltaic short-circuit current temperature coefficient measurements
Author :
Carl R. Osterwald;Mark Campanelli;George J. Kelly;Rafell Williams
Author_Institution :
National Renewable Energy Laboratory, Golden, Colorado, 80401, USA
fDate :
6/1/2015 12:00:00 AM
Abstract :
The changes in short-circuit current of photovoltaic (PV) cells and modules with temperature are routinely modeled through a single parameter, the temperature coefficient (TC). This parameter is vital for the translation equations used in system sizing, yet in practice is very difficult to measure. In this paper, we discuss these inherent problems and demonstrate how they can introduce unacceptably large errors in PV ratings. A method for quantifying the spectral dependence of TCs is derived, and then used to demonstrate that databases of module parameters commonly contain values that are physically unreasonable. Possible ways to reduce measurement errors are also discussed.
Keywords :
"Temperature measurement","Silicon","Temperature sensors","Current measurement","Semiconductor device measurement","Databases","Temperature distribution"
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
DOI :
10.1109/PVSC.2015.7355842