DocumentCode :
3711127
Title :
Comparison of curve correction procedure of current and voltage as per IEC 60891 for thin film technology
Author :
Sarah Sowmya Priya;O.S. Sastry;Birinchi Bora;Avinash Kumar
Author_Institution :
Karunya University, India
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
1
Lastpage :
4
Abstract :
The performance of PV module is compared through measuring I-V characteristics at STC. But usually in the real outdoors the PV module behaves differently. To estimate the power and energy rating under different climatic conditions, I-V curves are extrapolated by applying corrections. In this paper we have examined I-V curve´s correction procedure as per IEC 60891 for different temperature and irradiance conditions of three thin film PV technologies viz. CIGS, CdTe, Micro-morph, and a comparison is made with measured data in real outdoor conditions. Deviations from estimated and measured output for three different correction procedures are compared. The correction procedure 3 gives the best results as compared to procedure 1 & procedure 2.
Keywords :
"Temperature measurement","Voltage measurement","Estimation","IEC Standards","Temperature","II-VI semiconductor materials","Cadmium compounds"
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type :
conf
DOI :
10.1109/PVSC.2015.7355843
Filename :
7355843
Link To Document :
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