• DocumentCode
    3711239
  • Title

    Analysis of gaas photovoltaic device losses at high MOCVD growth rates

  • Author

    Kenneth J. Schmieder;Matthew P. Lumb;Michael K. Yakes;Mar?a Gonz?lez;Paul D. Cunningham;Ani Khachatrian;Mitchell F. Bennett;Louise C. Hirst;Nicole A. Kotulak;Ziggy Pulwin;Christopher G. Bailey;Seth M. Hubbard;Joseph S. Melinger;Chris W. Ebert;Robert J. Wa

  • Author_Institution
    U.S. Naval Research Laboratory, Washington, DC 20375 USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Gallium arsenide material has been deposited via metal organic chemical vapor deposition (MOCVD) at growth rates varying between 14 μm/hr and 56 μm/hr. Photovoltaic device results indicate a 6-7% relative decrease in efficiency between 14 and 56 μm/hr GaAs solar cells, due to a reduction in short-circuit current and open-circuit voltage. By simulating the experimental characterization data, it is established that performance losses are associated with rear surface recombination velocity and Shockley-Read-Hall lifetime. The relative impact of these loss mechanisms will be quantified and conclude with discussions on their mitigation.
  • Keywords
    "Photovoltaic systems","Substrates"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7355957
  • Filename
    7355957