DocumentCode :
3711313
Title :
Effect of series resistance on degradation of isc, power output and fill factor of HIT technology
Author :
Rashmi Singh;Birinchi Bora;Kamlesh Yadav;O. S. Sastry;Mithilesh Kumar;Avinash Kumar; Renu;Manander Bangar;Supriya Rai;Arun Kumar
Author_Institution :
Nat. Inst. of Solar Energy, Gurgaon, India
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
1
Lastpage :
5
Abstract :
This paper presents the Dependency of Series Resistance over a wide range of Irradiance And Temperature for HIT Technology As Per IEC 61853-1. A quantitative assessment of the effect of series resistance on electrical performance parameters of HIT technology has been studied from long term outdoor performance data. Degradation of the performance of HIT technology after one year of outdoor exposure has been studied and observed that with the increase of Series resistance outdoor exposure fill factor, power and Isc decreases.
Keywords :
"Reliability","Photovoltaic cells","Current measurement","Irrigation","Indium phosphide","III-V semiconductor materials"
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type :
conf
DOI :
10.1109/PVSC.2015.7356032
Filename :
7356032
Link To Document :
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