• DocumentCode
    3711321
  • Title

    Effects of n-type hydrogenated microcrystalline silicon oxide film on performance of a-Si/c-Si heterojunction solar cells

  • Author

    Yue Zhang;Cao Yu;Miao Yang;Hui Yan;Jinyan Zhang;Xixiang Xu

  • Author_Institution
    Beijing University of Technology, Beijing 100124, PR China
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In this work, we studied the effect of alternative n-type doped layer by using hydrogenated microcrystalline silicon oxide (μc-SiOx:H(n)). The experimental results indicate that the solar cell with μc-SiOx:H(n) has a larger short-circuit current density (Jsc), while a lower fill factor (FF), compared to the cell with n-type hydrogenated amorphous silicon (a-Si:H(n)). External quantum efficiency (EQE) shows that the increase of Jsc is related to wider band gap and lower optical absorption of μc-SiOx:H(n). Numerical simulation of device performance suggests that the lower FF is due to a larger band offset at the i/n interface caused by lower electron affinity of μc-SiOx:H(n) materials. The details of the experiment and device characterization, such as the IV performance and EQE spectrum of cells using different n layers, transmittance and reflectance of different i/n stack layers, Raman spectra comparison, and band diagram characterization, will be presented in this paper.
  • Keywords
    "Optical films","Optical reflection","Optical refraction","Radiative recombination","Gain measurement","Volume measurement","Short-circuit currents"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7356040
  • Filename
    7356040