Title :
Fundamental studies of the adhesion of dust to PV module chemical and physical relationships at the microscale
Author :
Lawrence L. Kazmerski;Antonia Sonia A.C. Diniz;Cristiana Brasil Maia;Marcelo Machado Viana;Suellen C. Costa;Pedro P. Brito;Cl?udio Dias Campos;Lauro V. Machado Neto;Sergio de Morais Hanriot;Leila R. de Oliveira Cruz
Author_Institution :
RASEI, University of Colorado Boulder, Boulder, CO, USA
fDate :
6/1/2015 12:00:00 AM
Abstract :
PV module soiling is a growing area of concern for performance and reliability. This paper provides evaluations of the fundamental interactions of dust/soiling particles with a several PV module surfaces. The purpose is to investigate the basic mechanisms involving the chemistry, morphology and resulting particle adhesion to that first photon-incident surface The first-time evaluation and mapping of the chemistry of single dust particles from operating PV module surfaces is presented. The first direct measurements of the adhesive force of individual grains are reported, including correlations to the specific surface chemistry. Special nanoscale techniques using atomic force microscopy (AFM) are adapted to determine the force between the particle and the surface. Results are presented for samples under dry and moisture-exposed conditions confirming the effects of cementation for surfaces having organic/soluble mineral concentrations. Additionally, the effects of hydrocarbon fuels on the enhanced bonding and adhesive force of soiling particles to surfaces are determined for samples from urban and highly-trafficked regions. Comparisons between glass and superhydrophobic and superhydrophilic coatings are presented, showing the effectiveness of the lower-surface energy conditions on the particle adhesion. The potential, limitations of this novel proximal probe technique are discussed in terms of the results and initial, proof-of-concept experiments.
Keywords :
"Surface morphology","Adhesives","Force","Surface treatment","Chemicals","Electronic mail","Detectors"
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
DOI :
10.1109/PVSC.2015.7356135