Title :
Transparent electrodes in silicon heterojunction solar cells: Influence on carrier recombination
Author :
Andrea Tomasi;Florent Sahli;Lorenzo Fanni;Johannes P. Seif;Silvia Martin de Nicolas;Niels Holm;Jonas Geissb?hler;Bertrand Paviet-Salomon;Philipp L?per;Sylvain Nicolay;Stefaan De Wolf;Christophe Ballif
Author_Institution :
Photovoltaics and Thin-Film Electronics Laboratory, Institute of Microengineering (IMT), ?cole Polytechnique F?d?rale de Lausanne (EPFL), Neuch?tel, 2000, Switzerland
fDate :
6/1/2015 12:00:00 AM
Abstract :
Hole and electron collectors in silicon heterojunction solar cells consist of hydrogenated amorphous silicon layer stacks deposited on the crystalline silicon wafer surfaces. Charge carrier extraction from these layers is achieved by electrodes consisting of a transparent conductive oxide and a metal layer. Earlier, the mere presence of the transparent conductive oxide layer on top of the hole collecting stack was shown to alter minority carrier lifetimes, at low minority injection levels, of the crystalline silicon absorber. In this work, we present a detailed investigation of the magnitude and nature of these effects and discuss their impact on silicon heterojunction solar cell performance for the different device architectures.
Keywords :
"Thickness measurement","Energy measurement","Pressure measurement","Silicon","Indexes","Surface treatment"
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
DOI :
10.1109/PVSC.2015.7356145