• DocumentCode
    3711519
  • Title

    Towards a monolithic, substrate-reusable and an all-epitaxial design for III?V-on-Si solar cells

  • Author

    Nikhil Jain;Michael Clavel;Patrick Goley;Mantu Hudait

  • Author_Institution
    Virginia Tech, Blacksburg, 24060, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Integration of III-V multijunction solar cells on Si substrate can address the future levelized cost of energy by unifying the high-efficiency merits of III-V materials with the low-cost and abundance of Si. A Si-compatible monolithically integrated 3J InGaP/GaAs/Ge-Si cell design with a hybrid Ge-Si bottom cell is investigated. Utilizing a combination of comprehensive modeling and experimental material characterization techniques, we present our results for ultrathin epitaxial Ge directly grown on Si substrate using molecular beam epitaxy. Virtual “Ge-on-Si” substrates could provide a large-area, low-cost alternative to expensive GaAs wafers, a promising step towards realizing monolithic, high-efficiency and low-cost III-V-on-Si photovoltaics.
  • Keywords
    "Silicon","Epitaxial growth","Substrates","Thickness measurement","Atomic measurements","Rough surfaces","Surface roughness"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7356241
  • Filename
    7356241