• DocumentCode
    3711575
  • Title

    Changing in irradiation behavior and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si solar cells

  • Author

    Johannes A. Weicht;Frank U. Hamelmann;Grit Behrens

  • Author_Institution
    University of Applied Sciences Bielefeld, Artilleriestra?e 9a, 32427 Minden, Germany
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In our work we observe the light behavior before and after light-induced degradation of amorphous/microcrystalline (a-Si/μc-Si) tandem silicon-based solar cells. We show that during light-induced degradation the efficiency increases for illumination levels lower than standard test condition illumination. Additionally we examine the temperature coefficient of the open circuit voltage, short circuit current and fill factor. The temperature-coefficient of silicon-based thin film solar cells varies during the light-induced degradation.
  • Keywords
    "Temperature measurement","Photovoltaic cells","Degradation","Radiation effects","Temperature","Temperature dependence","Photovoltaic systems"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7356298
  • Filename
    7356298