DocumentCode
3711587
Title
Quantum efficiency simulations with inputs from spectroscopic ellipsometry for evaluation of carrier collection in a-Si:H solar cells
Author
Puruswottam Aryal;Zhiquan Huang;Sylvain Marsillac;Nikolas J. Podraza;Robert W. Collins
Author_Institution
Center for Photovoltaics Innovation & Commercialization and Department of Physics & Astronomy, University of Toledo, OH, USA
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
1
Lastpage
4
Abstract
We have employed optical simulations based on input from ex-situ spectroscopic ellipsometry (SE) to predict external quantum efficiency (EQE) spectra of hydrogenated amorphous silicon (a-Si:H) solar cells prepared using one and two-step i-layers. The simulations are based entirely on structural parameters, including layer thicknesses and material volume fractions, as well as spectroscopic optical properties for each of the component layers. All inputs are derived from through-the-glass and film-side SE analysis of device stacks. A comparison between simulated and measured EQE spectra provide insights into recombination losses in a-Si:H solar cells, as the simulated results are not affected by such losses.
Keywords
"Photovoltaic cells","Optical films","Wavelength measurement","Optical sensors","Optical variables measurement","Loss measurement","Optical losses"
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type
conf
DOI
10.1109/PVSC.2015.7356311
Filename
7356311
Link To Document