• DocumentCode
    3711587
  • Title

    Quantum efficiency simulations with inputs from spectroscopic ellipsometry for evaluation of carrier collection in a-Si:H solar cells

  • Author

    Puruswottam Aryal;Zhiquan Huang;Sylvain Marsillac;Nikolas J. Podraza;Robert W. Collins

  • Author_Institution
    Center for Photovoltaics Innovation & Commercialization and Department of Physics & Astronomy, University of Toledo, OH, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We have employed optical simulations based on input from ex-situ spectroscopic ellipsometry (SE) to predict external quantum efficiency (EQE) spectra of hydrogenated amorphous silicon (a-Si:H) solar cells prepared using one and two-step i-layers. The simulations are based entirely on structural parameters, including layer thicknesses and material volume fractions, as well as spectroscopic optical properties for each of the component layers. All inputs are derived from through-the-glass and film-side SE analysis of device stacks. A comparison between simulated and measured EQE spectra provide insights into recombination losses in a-Si:H solar cells, as the simulated results are not affected by such losses.
  • Keywords
    "Photovoltaic cells","Optical films","Wavelength measurement","Optical sensors","Optical variables measurement","Loss measurement","Optical losses"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7356311
  • Filename
    7356311