DocumentCode
3711615
Title
Effects of arsenic source molecule on N-H related defects formation in GaAsN grown by chemical beam epitaxy
Author
Yoshio Ohshita;Koshiro Demizu;Omar Elleuch;Kazuma Ikede;Nobuaki Kojima;Hideaki Machida;Hiroshi Sudoh;Masafumi Yamaguchi
Author_Institution
Toyota Technological Institute, 2-12-1 Hisakata, Tempaku, Nagoya, 468-8511 Japan
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
1
Lastpage
4
Abstract
The formation mechanism of N-H related defects in GaAsN grown by chemical beam epitaxy is studied by the isotope effects on the local vibration modes (LVMs). When the deuterated tris(dimethylamino)arsenic (TDMAAs) is used as an arsenic source, new signals appear in the spectrum and they are attributed to the N-D related LVM signals. Therefore, the As source molecule contributes to the formation of N-H related defects in GaAsN. When TDMAAs flow rate increases, the concentration of N-H related defects at 2952cm-1 increases. These results suggest that N-CH3 in the molecule is one of the origins of the N-H at 2952cm-1 in the grown films.
Keywords
"Lattices","Molecular beam epitaxial growth","Nitrogen","Arsenic","Indexes"
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type
conf
DOI
10.1109/PVSC.2015.7356339
Filename
7356339
Link To Document