• DocumentCode
    3711635
  • Title

    Evaluation of the CIGS precursor layer deposited by CuGa-NaF sputtering target and its effect for Na distribution

  • Author

    Keita Umemoto;Ichiro Shiono;Hajime Chiba;Yuichi Kondo;Shoubin Zhang

  • Author_Institution
    Mitsubishi Materials Corporation Sanda Plant, Sanda-shi, Hyogoken, 669-1339, Japan
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The purpose of this study is to understand the relationship between the precursor layer deposited by CuGa-NaF sputtering target and selenidization process. The addition of Na was carried out by using the CuGa-NaF sputtering target. In the CuGa-NaF precursor film, the presence of Na-Ga-F compound was observed. The desorption of fluoride gas from the Na-Ga-F compound occurred, and it accompanied the migration of Ga element. The desorption of fluoride gas enhanced the reactivity with the Se gas in the selenization process. On the other hand, the presence of Na and the migration of Ga impeded the interdiffusion of In and Ga. The decomposition temperature of H2Se gas and the temperature of formation of CIGS were important for uniformity of composition in selenization process. By optimizing the CuGa-NaF film thickness and the multilayer film structure, a CIGS film with a graded composition of In/Ga and the uniformly incorporation Na was obtained.
  • Keywords
    "Films","Heating","Glass","Silicon","Photovoltaic cells","Substrates","Sodium"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7356359
  • Filename
    7356359