Title :
Interface processing of amorphous-crystalline silicon heterojunction prior to the formation of amorphous-to-nanocrystalline transition phase
Author :
Liping Zhang; Wenzhu Liu; Wanwu Guo; Jian Bao; Xiaoyu Zhang; Jinning Liu; Dongliang Wang; Fanying Meng; Zhengxin Liu
Author_Institution :
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 200050, China
fDate :
6/1/2015 12:00:00 AM
Abstract :
Two effective interface optimization, including hydrogen-plasma treatment (HPT) and oxygen incorporation (OIn), have been investigated to optimization interface structure and promote the formation of hydrogenated amorphous silicon (a-Si:H) bulk with amorphous-to-nanocrystalline transition phase based on the surface passivation of crystalline silicon (c-Si). Both multi-steps HPT and the intentional OIn are capable of producing a compact interface and a transition phase bulk. An appropriate multi-steps HPT is taking responsibility for modifying the a-Si:H bulk to a transition phase while an effective OIn makes a disordering interface and a crystallites- isolated bulk structure.
Keywords :
"Silicon","Density measurement","Charge carrier density","Ellipsometry","Films","Charge carrier lifetime","Indexes"
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
DOI :
10.1109/PVSC.2015.7356403