DocumentCode :
3711700
Title :
Arc-fault unwanted tripping survey with UL 1699B-listed products
Author :
Jay Johnson;Kenneth M. Armijo;Modi Avrutsky;Daniel Eizips;Sergey Kondrashov
Author_Institution :
Sandia National Laboratories, Albuquerque, NM, 87185, USA
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
1
Lastpage :
6
Abstract :
Since adoption of the 2011 National Electrical Code®, many photovoltaic (PV) direct current (DC) arc-fault circuit interrupters (AFCIs) and arc-fault detectors (AFDs) have been introduced into the PV market. To meet the Code requirements, these products must be listed to Underwriters Laboratories (UL) 1699B Outline of Investigation. The UL 1699B test sequence was designed to ensure basic arc-fault detection capabilities with resistance to unwanted tripping; however, field experiences with AFCI/AFD devices have shown mixed results. In this investigation, independent laboratory tests were performed with UL-listed, UL-recognized, and prototype AFCI/AFDs to reveal any limitations with state-of-the-art arc-fault detection products. By running AFCIs and stand-alone AFDs through realistic tests beyond the UL 1699B requirements, many products were found to be sensitive to unwanted tripping or were ineffective at detecting harmful arc-fault events. Based on these findings, additional experiments are encouraged for inclusion in the AFCI/AFD design process and the certification standard to improve products entering the market.
Keywords :
"Switches","Inverters","Switching circuits","Electromagnetics","Indexes","Energy measurement","Frequency conversion"
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type :
conf
DOI :
10.1109/PVSC.2015.7356427
Filename :
7356427
Link To Document :
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