DocumentCode
3711723
Title
[Front cover]
fYear
2015
Abstract
The following topics are dealt with: ATE development; support infrastructure management; design for test/BIT; obsolescence management; ATE software; test results reliability; test results accuracy; prognostics; health monitoring; software testing; diagnostic techniques; testing techniques; FPGA applications; supportability enhancement; TPS development solutions; and instrumentation architectures.
Publisher
ieee
Conference_Titel
IEEE AUTOTESTCON, 2015
Type
conf
DOI
10.1109/AUTEST.2015.7356452
Filename
7356452
Link To Document