DocumentCode :
3711736
Title :
Wrapper scan chains balance algorithm base on twice assigned by difference and mean value
Author :
Deng Libao;Ning Fu;Qiao Liyan
Author_Institution :
School of Information and Electrical Engineering, Harbin Institute of Technology at Weihai, China
fYear :
2015
Firstpage :
52
Lastpage :
57
Abstract :
The core test application time is based on the maximum scan-in/scan-out chains. To design a well balance wrapper scan chains is an important approach to reduce the test application time and test cost. We propose a wrapper scan chains balance algorithm base on twice-assigned algorithm by the chains difference and mean value. By selecting a standard chain with its length L, calculating the mean value V of all scan chains, then finding the chains which length longer than L from all internal scan chains of the IP core, computing the difference D with V of these chains, the first assignment is achieved by regarding these chains as V. By sorting the length shorter than L and D in descending order of length, the second assignment is achieved by assigning to the enable shortest or longest wrapper scan chain according whether D is positive or negative. The experimental results for the ITC´02 SOC Test Benchmark showed that the algorithm in this paper can get better balanced result when compared to the existing solutions.
Keywords :
"Partitioning algorithms","Algorithm design and analysis","Silicon","Approximation algorithms","Electrical engineering","Very large scale integration","Complexity theory"
Publisher :
ieee
Conference_Titel :
IEEE AUTOTESTCON, 2015
Type :
conf
DOI :
10.1109/AUTEST.2015.7356466
Filename :
7356466
Link To Document :
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