DocumentCode :
3711746
Title :
Understanding optimal performance of electronic circuitry
Author :
Larry V. Kirkland
Author_Institution :
WesTest Engineering Corp., A RPS HOLDINGS company, 810 Shepard Lane, Farmington, Utah 84025, United States of America
fYear :
2015
Firstpage :
115
Lastpage :
120
Abstract :
How do we evaluate automatically the optimal performance measurements of electronic circuitry? There are many new and interesting techniques for testing which crop up quite regularly. However, there must be a road map to better understand optimal performance of electronic circuitry. Optimal performance means the circuit is functioning at its´ peak performance which means its´ “Mean Time Between Failure” (MTBF) is the longest time between failures for the circuitry and the circuitry is optimally reliable. In other words, the test and repair process was performed by using an optimizing method thus making the MTBF high and therefore the safety of flight or the reliability of the system is enhanced.
Keywords :
"Testing","Measurement units","Qualifications","Random access memory","Switches","Robustness"
Publisher :
ieee
Conference_Titel :
IEEE AUTOTESTCON, 2015
Type :
conf
DOI :
10.1109/AUTEST.2015.7356476
Filename :
7356476
Link To Document :
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