DocumentCode
3711773
Title
Reducing the cost of test for high-speed serial buses with COTS FPGA technology
Author
Chris Nunn
Author_Institution
High Speed Serial Test, National Instruments, Austin, TX, United States of America
fYear
2015
Firstpage
288
Lastpage
290
Abstract
Technology is trending towards more data, faster rates, smaller size, and less power. Better performance with a reduced footprint is hard to accomplish, but about 10 years ago, engineers solved this challenge for data movement by moving to a different digital communication paradigm. Instead of the traditional parallel buses that transmit clock and data separately, high-speed serial technology emerged that allows transmission of encoded data without the need for a separate clock signal. This has allowed industry to break the 1-2 GHz practical limit inherent to parallel busses and reach speeds over 50 GHz.
Keywords
"Field programmable gate arrays","Protocols","Oscilloscopes","Test equipment","Physical layer"
Publisher
ieee
Conference_Titel
IEEE AUTOTESTCON, 2015
Type
conf
DOI
10.1109/AUTEST.2015.7356505
Filename
7356505
Link To Document