• DocumentCode
    3711773
  • Title

    Reducing the cost of test for high-speed serial buses with COTS FPGA technology

  • Author

    Chris Nunn

  • Author_Institution
    High Speed Serial Test, National Instruments, Austin, TX, United States of America
  • fYear
    2015
  • Firstpage
    288
  • Lastpage
    290
  • Abstract
    Technology is trending towards more data, faster rates, smaller size, and less power. Better performance with a reduced footprint is hard to accomplish, but about 10 years ago, engineers solved this challenge for data movement by moving to a different digital communication paradigm. Instead of the traditional parallel buses that transmit clock and data separately, high-speed serial technology emerged that allows transmission of encoded data without the need for a separate clock signal. This has allowed industry to break the 1-2 GHz practical limit inherent to parallel busses and reach speeds over 50 GHz.
  • Keywords
    "Field programmable gate arrays","Protocols","Oscilloscopes","Test equipment","Physical layer"
  • Publisher
    ieee
  • Conference_Titel
    IEEE AUTOTESTCON, 2015
  • Type

    conf

  • DOI
    10.1109/AUTEST.2015.7356505
  • Filename
    7356505