• DocumentCode
    3711789
  • Title

    Common BIT test station agile development approach

  • Author

    W. Tod Newman;Gerald Emmert

  • Author_Institution
    Systems Design and Performance Directorate, Raytheon Missile Systems, Tucson, AZ, United States of America
  • fYear
    2015
  • Firstpage
    380
  • Lastpage
    384
  • Abstract
    Raytheon Tucson has multiple products that are designed to utilize Built-In Test (BIT) as the primary Unit Under Test (UUT) test approach. In order to perform BIT on many of Raytheon´s products a minimal amount of Test Equipment is required to provide power and communicate to the UUT. During 2012 a need arose for a common piece of test equipment which could replace the BIT test equipment used by multiple programs in a new, multi-program factory. This abstract and the resultant paper outlines the unique agile product development process used to design this new test system where the requirements from these multiple programs were gathered, consolidated, and ranked into a common specification that allowed for the development and deployment of a Common BIT test station that is in use at Raytheon.
  • Keywords
    "Production facilities","Product development","Test equipment","Missiles","Computer architecture","Delays"
  • Publisher
    ieee
  • Conference_Titel
    IEEE AUTOTESTCON, 2015
  • Type

    conf

  • DOI
    10.1109/AUTEST.2015.7356521
  • Filename
    7356521