DocumentCode :
3712575
Title :
Development of Bump Support Film (BSF) for expanding the size of WLCSP
Author :
Masanori Yamagishi;Shinya Takyu;Naoya Saiki;Akinori Sato;Rey Alvarado
Author_Institution :
Lintec Corporation, 5-14-42 Nishiki-cho, Warabi-shi, Saitama 335-0005, Japan
fYear :
2015
Firstpage :
29
Lastpage :
32
Abstract :
Solder joint crack is increasing with increasing of warpage caused by larger Wafer Level Chip Size Package (WLCSP). In this study, we studied new Bump Support Film (BSF) made of back grind tape and thermosetting epoxy resin, which covers the bottom of bumps by heat lamination. We succeeded to form the BSF without voids at the bottom of the bumps by optimizing the thickness of thermosetting epoxy resin layer. We also succeeded to remove residues of BSF at top of the bumps by dicing process. In addition, the board level test of IC chip with BSF shows no electrical defect after reflow process.
Keywords :
"Epoxy resins","Lamination","Curing","Semiconductor device reliability","Surface treatment","Films"
Publisher :
ieee
Conference_Titel :
CPMT Symposium Japan (ICSJ), 2015 IEEE
Print_ISBN :
978-1-4799-8814-3
Type :
conf
DOI :
10.1109/ICSJ.2015.7357352
Filename :
7357352
Link To Document :
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