Title : 
Fault collapsing for digital circuits based on relations between stuck-at faults
         
        
            Author : 
Tigranuhi Grigoryan;Heghineh Malkhasyan;Gevorg Mushyan;Valery Vardanian
         
        
            Author_Institution : 
Educational &
         
        
        
        
        
            Abstract : 
A way for fault collapsing is proposed for digital circuits based on the relations of fault equivalence and fault dominance. A new notion of strict structural fault dominance is proposed for single stuck-at faults on input/output lines of logical gates. Experiments are conducted on combinational circuits of ISCAS´85 and combinational parts of sequential benchmark circuits of ISCAS´89 benchmark circuits. Fault collapsing for most of the circuits is about 60-70%.
         
        
            Keywords : 
"Circuit faults","Logic gates","Benchmark testing","Combinational circuits","Digital circuits","Sequential circuits","Very large scale integration"
         
        
        
            Conference_Titel : 
Computer Science and Information Technologies (CSIT), 2015
         
        
        
            DOI : 
10.1109/CSITechnol.2015.7358242