• DocumentCode
    3715000
  • Title

    Characterization of uncertainties in RF adapters for EMC measurements

  • Author

    Jian Song; Hon Tat Hui

  • Author_Institution
    Dept. of Electr. &
  • fYear
    2013
  • fDate
    5/1/2013 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper focuses on the uncertainties of RF adapters occur during EMC measurements, which are often not taken into consideration by some of the testing laboratories. The performances of various RF adapters were evaluated experimentally with a frequency range from 100 kHz to 8.5 GHz. The results showed that although the uncertainties contributed by the RF adapters are negligible at the above mentioned frequency range, some defect RF adapters may have a higher insertion loss which will significantly affect the overall measurement uncertainties if not treated properly.
  • Keywords
    "Radio frequency","Instruments","Loss measurement","Frequency measurement","Standards","Uncertainty","Measurement uncertainty"
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2013 Asia-Pacific Symposium on
  • Type

    conf

  • DOI
    10.1109/APEMC.2013.7360615
  • Filename
    7360615