DocumentCode
3715000
Title
Characterization of uncertainties in RF adapters for EMC measurements
Author
Jian Song; Hon Tat Hui
Author_Institution
Dept. of Electr. &
fYear
2013
fDate
5/1/2013 12:00:00 AM
Firstpage
1
Lastpage
3
Abstract
This paper focuses on the uncertainties of RF adapters occur during EMC measurements, which are often not taken into consideration by some of the testing laboratories. The performances of various RF adapters were evaluated experimentally with a frequency range from 100 kHz to 8.5 GHz. The results showed that although the uncertainties contributed by the RF adapters are negligible at the above mentioned frequency range, some defect RF adapters may have a higher insertion loss which will significantly affect the overall measurement uncertainties if not treated properly.
Keywords
"Radio frequency","Instruments","Loss measurement","Frequency measurement","Standards","Uncertainty","Measurement uncertainty"
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2013 Asia-Pacific Symposium on
Type
conf
DOI
10.1109/APEMC.2013.7360615
Filename
7360615
Link To Document