DocumentCode :
3715112
Title :
Toward limits of constructing reliable memories from unreliable components
Author :
Lav R. Varshney
Author_Institution :
Department of Electrical and Computer Engineering, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, United States of America
fYear :
2015
Firstpage :
114
Lastpage :
118
Abstract :
There has been long-standing interest in constructing reliable memory systems from unreliable components like noisy bit-cells and noisy logic gates, under circuit complexity constraints. Prior work has focused exclusively on constructive achievability results, but here we develop converse theorems for this problem for the first time. The basic technique relies on entropy production/dissipation arguments and balances the need to dissipate entropy with the redundancy of the code employed. A bound from the entropy dissipation capability of noisy logic gates is used via a sphere-packing argument. Although a large gap remains between refined achievability results stated herein and the converse, some suggestions for ways to move forward beyond this first step are provided.
Keywords :
"Decoding","Entropy","Registers","Noise measurement","Integrated circuit reliability","Complexity theory"
Publisher :
ieee
Conference_Titel :
Information Theory Workshop - Fall (ITW), 2015 IEEE
Type :
conf
DOI :
10.1109/ITWF.2015.7360745
Filename :
7360745
Link To Document :
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