• DocumentCode
    3717566
  • Title

    Test-driven modeling of embedded systems

  • Author

    Allan Munck;Jan Madsen

  • Author_Institution
    Department of Systems Engineering at GN Resound & Section of Embedded Systems Engineering at Department of Applied Mathematics and Computer Science, Technical University of Denmark, Denmark
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    To benefit maximally from model-based systems engineering (MBSE) trustworthy high quality models are required. From the software disciplines it is known that test-driven development (TDD) can significantly increase the quality of the products. Using a test-driven approach with MBSE may have a similar positive effect on the quality of the system models and the resulting products and may therefore be desirable. To define a test-driven model-based systems engineering (TD-MBSE) approach, we must define this approach for numerous sub disciplines such as modeling of requirements, use cases, scenarios, behavior, architecture, etc. In this paper we present a method that utilizes the formalism of timed automatons with formal and statistical model checking techniques to apply TD-MBSE to the modeling of system architecture and behavior. The results obtained from applying it to an industrial case suggest that our method provides a sound foundation for rapid development of high quality system models.
  • Keywords
    "Unified modeling language","Model checking","Automata","Analytical models","Software"
  • Publisher
    ieee
  • Conference_Titel
    Nordic Circuits and Systems Conference (NORCAS): NORCHIP & International Symposium on System-on-Chip (SoC), 2015
  • Type

    conf

  • DOI
    10.1109/NORCHIP.2015.7364410
  • Filename
    7364410