Title :
Test wrapper bandwidth assignment for minimizing the SoC test application time
Author :
Cheng-Hsun Nien; Chun-Hua Cheng; Shih-Hsu Huang
Author_Institution :
Department of Electronic Engineering, Chung Yuan Christian University, Taoyuan City, Taiwan, R.O.C.
Abstract :
The test application time of a core may decrease as the bandwidth of its test wrapper increases. Since the total bandwidth of a TAM is fixed, there is a need to properly determine the bandwidth of each test wrapper for minimizing the total test application time. Based on this observation, in this paper, we propose an integer linear programming (ILP) approach to perform the simultaneous application of test wrapper bandwidth assignment and test scheduling for minimizing the total test application time. The main contributions of our work are elaborated below. First, Our approach is the first work that performs the simultaneous application of test wrapper bandwidth assignment and test scheduling for minimizing the total test application time. Secondly, the proposed ILP approach guarantees solving this problem optimally. Compared with the previous work, in which the bandwidth of each test wrapper is fixed, experimental results show that our approach can reduce 21% total test application time.
Keywords :
"Bandwidth","Upper bound","Integer linear programming","Testing","Algorithm design and analysis","Scheduling","Wires"
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015 10th International
Print_ISBN :
978-1-4673-9690-5
DOI :
10.1109/IMPACT.2015.7365237