• DocumentCode
    3718363
  • Title

    Lifetime prediction of the epoxy resin adhesive under the optical performance degradation process

  • Author

    Ching-Yu Chen; Rong-Fong Wu; Chun-Ying Huang; Kuan-Jung Chung

  • Author_Institution
    Graduate Institute of Photonics, National Changhua University of Education, 500,Taiwan
  • fYear
    2015
  • Firstpage
    213
  • Lastpage
    216
  • Abstract
    In this study, an epoxy resin adhesive called optically clear resin (OCR) was prepared. The type I (time censored) accelerated degradation tests associated with various temperature-humidity conditions were performed to evaluate the lifetimes of the test vehicle. The optical performance, Yellow index (YI), was used and the failure criterion was defined when the YI reaches a specific value of 2. The test results indicate that the degradation path of test samples represent the brownian motion so that a Weiner process was applied to model the degradation of test samples. A typical Monde Carlo simulation was performed to predict the lifetimes at the threshold level for each test condition. The simulation results present that the lifetimes at the test condition 85°C/85% RH and 75°C/85% RH are 2216 hours and 3322 hours respectively. As the results, the acceleration factor and activation energy was calculated to be 1.5 and 0.6874 ev/K respectively. Furthermore, a bogey test method was used to determine the sample size and failure free test duration according to the specific reliability goal and confidence level.
  • Keywords
    "Optical character recognition software","Degradation","Humidity","Life estimation","Indexes","Reliability","Temperature"
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015 10th International
  • Print_ISBN
    978-1-4673-9690-5
  • Type

    conf

  • DOI
    10.1109/IMPACT.2015.7365251
  • Filename
    7365251