DocumentCode
3718363
Title
Lifetime prediction of the epoxy resin adhesive under the optical performance degradation process
Author
Ching-Yu Chen; Rong-Fong Wu; Chun-Ying Huang; Kuan-Jung Chung
Author_Institution
Graduate Institute of Photonics, National Changhua University of Education, 500,Taiwan
fYear
2015
Firstpage
213
Lastpage
216
Abstract
In this study, an epoxy resin adhesive called optically clear resin (OCR) was prepared. The type I (time censored) accelerated degradation tests associated with various temperature-humidity conditions were performed to evaluate the lifetimes of the test vehicle. The optical performance, Yellow index (YI), was used and the failure criterion was defined when the YI reaches a specific value of 2. The test results indicate that the degradation path of test samples represent the brownian motion so that a Weiner process was applied to model the degradation of test samples. A typical Monde Carlo simulation was performed to predict the lifetimes at the threshold level for each test condition. The simulation results present that the lifetimes at the test condition 85°C/85% RH and 75°C/85% RH are 2216 hours and 3322 hours respectively. As the results, the acceleration factor and activation energy was calculated to be 1.5 and 0.6874 ev/K respectively. Furthermore, a bogey test method was used to determine the sample size and failure free test duration according to the specific reliability goal and confidence level.
Keywords
"Optical character recognition software","Degradation","Humidity","Life estimation","Indexes","Reliability","Temperature"
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015 10th International
Print_ISBN
978-1-4673-9690-5
Type
conf
DOI
10.1109/IMPACT.2015.7365251
Filename
7365251
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