DocumentCode :
3718501
Title :
A Family of Rad-Hard ADC with Flash Architecture
Author :
Umberto Gatti;Cristiano Calligaro
Author_Institution :
RedCat Devices, Milan, Italy
fYear :
2015
Firstpage :
1
Lastpage :
5
Abstract :
This work presents a family of rad-hard ADCs with flash architecture for space applications. The converters, featuring from 4 to 8-Bit at 10MS/s, have been developed using rad-hardening techniques at architecture, circuit and layout levels. The 4-Bit ADC has been integrated in two standard CMOS 0.18-μm technologies by TowerJazz and XFAB. The prototypes have been tested under Co-60 and showed same radiation immunities up to 300krad(Si), demonstrating the effectiveness of the proposed radiation-hardening methodology.
Keywords :
"Radiation hardening (electronics)","Layout","CMOS integrated circuits","CMOS technology","Topology","Standards","Transistors"
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
Type :
conf
DOI :
10.1109/RADECS.2015.7365576
Filename :
7365576
Link To Document :
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