Title :
A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing
Author :
A. Bosser;V. Gupta;G. Tsiligiannis;R. Ferraro;C. Frost;A. Javanainen;H. Puchner;M. Rossi;F. Saigne;A. Virtanen;F. Wrobel;A. Zadeh;L. Dilillo
Author_Institution :
Dept. of Phys., Univ. of Jyvaskyla, Jyvaskyla, Finland
Abstract :
A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.
Keywords :
"Random access memory","Sensitivity","Market research","Arrays","Electronic mail","Protons","Radiation effects"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365578
