Title :
Connection of the Parametric and Functional Control for TID Testing of Complex VLSI Circuits
Author :
Vladimir A. Marfin;Pavel V. Nekrasov;Ilya O. Loskutov
Author_Institution :
Inst. of Extreme Appl. Electron., Nat. Res. Nucl. Univ. MEPHI, Moscow, Russia
Abstract :
The article describes an original technique for TID testing of complex VLSI circuits (microprocessors) based on combined use of parametric and functional control. The resulting dependences obtained in radiation experiment are qualitatively confirmed by circuit simulation.
Keywords :
"Semiconductor device modeling","Integrated circuit modeling","CMOS integrated circuits","Inverters","Very large scale integration","Microprocessors","Degradation"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365595
