Title :
Dark Current Spectroscopy on Alpha Irradiated CMOS Image Sensors
Author :
Jean-Marc Belloir;Vincent Goiffon;Cedric Virmontois;Melanie Raine;Philippe Paillet;Pierre Magnan;Olivier Gilard
Abstract :
Dark Current Spectroscopy of radiation-induced defects is tested for the first time in CMOS Image Sensors. Several dark current peaks are observed and their evolution with fluence, particle energy and temperature is studied.
Keywords :
"Dark current","Alpha particles","Current measurement","Radiation effects","Photodiodes","Ionization","Spectroscopy"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365597
