Title :
Dose Rate Switching Technique to Estimate the Low Dose Rate Response of Bipolar Technologies
Author :
J. Boch;A. Michez;M. Rousselet;S. Dhombres;L. Dusseau;E. Lorfevre;N. Chatry;N. Sukhaseum;F. Saigne
Author_Institution :
IES, Univ. Montpellier, Montpellier, France
Abstract :
The Switched Dose Rate technique is investigated when devices do not exhibit ELDRS. Experimental data and modeling results are presented and discussed in terms of hardness assurance.
Keywords :
"Degradation","Radiation effects","Spontaneous emission","Optical switches","Electron traps"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365604
