DocumentCode
3718535
Title
Evaluation of the Post-Irradiation Temperature Dependence of Operational Amplifier Input Bias Current
Author
Alexander S. Rodin;Alexander S. Bakerenkov;Viacheslav S. Pershenkov;Vladislav A. Felitsyn;Alina G. Miroshnichenko;Nikita S. Glukhov
Author_Institution
Nat. Res. Nucl. Univ. MEPhI (Moscow Eng. Phys. Inst.), Moscow, Russia
fYear
2015
Firstpage
1
Lastpage
3
Abstract
The Evaluation technique for radiation degradation of temperature dependences of operational amplifier input bias currents was developed. The technique can improve the accuracy of prediction of radiation hardness of operational amplifiers in full operation temperature range.
Keywords
"Temperature measurement","Temperature dependence","Operational amplifiers","Temperature distribution","Radiation effects","Current measurement"
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN
978-1-5090-0232-0
Type
conf
DOI
10.1109/RADECS.2015.7365610
Filename
7365610
Link To Document