Title :
Evaluation of the Post-Irradiation Temperature Dependence of Operational Amplifier Input Bias Current
Author :
Alexander S. Rodin;Alexander S. Bakerenkov;Viacheslav S. Pershenkov;Vladislav A. Felitsyn;Alina G. Miroshnichenko;Nikita S. Glukhov
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI (Moscow Eng. Phys. Inst.), Moscow, Russia
Abstract :
The Evaluation technique for radiation degradation of temperature dependences of operational amplifier input bias currents was developed. The technique can improve the accuracy of prediction of radiation hardness of operational amplifiers in full operation temperature range.
Keywords :
"Temperature measurement","Temperature dependence","Operational amplifiers","Temperature distribution","Radiation effects","Current measurement"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365610
