• DocumentCode
    3718538
  • Title

    Experimental Technique for Determination of ELDRS-Free Devices

  • Author

    Vasily S. Anashin;Viacheslav S. Pershenkov;Alexander S. Bakerenkov;Pavel A. Chubunov;Anatoly V. Solomatin;Alexander S. Rodin;Vladislav A. Felitsyn

  • Author_Institution
    Inst. of Space Device Eng., Branch of Joint Stock Co. United Rocket &
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The technique for experimental determination of ELRDS-free devices is described. The technique is based on the conversion model of low dose rate effect in bipolar transistors.
  • Keywords
    "Radiation effects","Integrated circuits","Annealing","Temperature distribution","Temperature dependence","Degradation","Performance evaluation"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365613
  • Filename
    7365613
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718538