Title :
Experimental Technique for Determination of ELDRS-Free Devices
Author :
Vasily S. Anashin;Viacheslav S. Pershenkov;Alexander S. Bakerenkov;Pavel A. Chubunov;Anatoly V. Solomatin;Alexander S. Rodin;Vladislav A. Felitsyn
Author_Institution :
Inst. of Space Device Eng., Branch of Joint Stock Co. United Rocket &
Abstract :
The technique for experimental determination of ELRDS-free devices is described. The technique is based on the conversion model of low dose rate effect in bipolar transistors.
Keywords :
"Radiation effects","Integrated circuits","Annealing","Temperature distribution","Temperature dependence","Degradation","Performance evaluation"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365613
