Title :
Grenoble Large Scale Facilities for Advanced Characterisation of Microelectronics Devices
Author :
J. Beaucour;J. Segura-Ruiz;B. Giroud;E. Capria;E. Mitchell;C. Curfs;J. C. Royer;M. Baylac;F. Villa;S. Rey
Author_Institution :
Inst. LAUE-LANGEVIN, Grenoble, France
Abstract :
The French IRT-Nanoelec consortium in collaboration with GENEPI2 accelerator is offering world unique and complementary techniques for Hirel components characterisation. Part of this capability is the high and low (thermal) energy neutron testing of devices.
Keywords :
"Neutrons","Radiation effects","Europe","Instruments","Laboratories","Microelectronics","Synchrotrons"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365616
