Title :
Identification of Authenticity of Microelectronic Devices Using Radiation Simulation Modeling
Author :
D. V. Boychenko;T. A. Kondratyeva;A. Yu. Nikiforov;Yu. A. Ozhegin;V. A. Telets
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI (Moscow Eng. Phys. Inst.), Moscow, Russia
Abstract :
The article outlines a methodological approach, core specifics and capabilities of radiation identification of microelectronic devices at a specified exposure to ionizing radiation.
Keywords :
"Microelectronics","Radiation effects","Integrated circuit modeling","Production","Object recognition","Physics","Consumer electronics"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365619
