• DocumentCode
    3718550
  • Title

    Investigation of Single Event Functional Interrupts in Microcontoller with PIC17 Architecture

  • Author

    Pavel V. Nekrasov;Andrey B. Karakozov;Dmitry V. Bobrovskyi;Vladimir A. Marfin

  • Author_Institution
    Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    the article is devoted to the study of single event functional interrupts in microprocessors and microcontrollers. SEFI detection method is discussed. The influence of supply voltage, operating frequency and program code on SEFI cross section is examined. In addition the new simplified method of SEFI cross-section calculation based on critical memory space estimation is presented.
  • Keywords
    "Random access memory","Hardware","Registers","Ground penetrating radar","Single event upsets","Microcontrollers"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365625
  • Filename
    7365625
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718550