Title :
Method of SEU-Hardness Assurance for SRAM with Error Correction Using Focused Laser Sources
Author :
Anna B. Boruzdina;Alexander A. Pechenkin;Igor B. Yashanin;Anastasiya V. Ulanova;Andrey V. Yanenko;Alexander I. Chumakov
Author_Institution :
MEPHI Specialized Electron. Syst., Nat. Res. Nucl. Univ., Moscow, Russia
Abstract :
In this work the analysis of possible approaches to SEU-hardness testing for SRAM with error correction were conducted. Efficiency of the aproach proposed by Aeroflex was evaluated, and the results of experimental investigation for 16 Mbit SRAM under heavy ion and focused laser irradaition were provided.
Keywords :
"Error correction","Random access memory","Radiation effects","Analytical models","Testing","Performance evaluation","Frequency measurement"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365632
