• DocumentCode
    3718557
  • Title

    Method of SEU-Hardness Assurance for SRAM with Error Correction Using Focused Laser Sources

  • Author

    Anna B. Boruzdina;Alexander A. Pechenkin;Igor B. Yashanin;Anastasiya V. Ulanova;Andrey V. Yanenko;Alexander I. Chumakov

  • Author_Institution
    MEPHI Specialized Electron. Syst., Nat. Res. Nucl. Univ., Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In this work the analysis of possible approaches to SEU-hardness testing for SRAM with error correction were conducted. Efficiency of the aproach proposed by Aeroflex was evaluated, and the results of experimental investigation for 16 Mbit SRAM under heavy ion and focused laser irradaition were provided.
  • Keywords
    "Error correction","Random access memory","Radiation effects","Analytical models","Testing","Performance evaluation","Frequency measurement"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365632
  • Filename
    7365632
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718557