Title :
Modeling Charge Buildup in Deposited Oxides under X-Ray and Gamma Irradiation
Author :
Anatoly A. Smolin;Armen V. Sogoyan;Anastasia V. Ulanova;Alexander A. Demidov
Author_Institution :
Specialized Electron. Syst., Moscow, Russia
Abstract :
Analysis of TID degradation differences for MOS-structures under x-ray and gamma irradiations is provided. Correlation between spatial distribution of hole traps in the oxide and TID degradation kinetic is determined.
Keywords :
"Radiation effects","Electron traps","Leakage currents","Degradation","Graphical models","Distribution functions"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365634
