• DocumentCode
    3718559
  • Title

    Modeling Charge Buildup in Deposited Oxides under X-Ray and Gamma Irradiation

  • Author

    Anatoly A. Smolin;Armen V. Sogoyan;Anastasia V. Ulanova;Alexander A. Demidov

  • Author_Institution
    Specialized Electron. Syst., Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Analysis of TID degradation differences for MOS-structures under x-ray and gamma irradiations is provided. Correlation between spatial distribution of hole traps in the oxide and TID degradation kinetic is determined.
  • Keywords
    "Radiation effects","Electron traps","Leakage currents","Degradation","Graphical models","Distribution functions"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365634
  • Filename
    7365634
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718559