Title :
Multiple Cell Upset Mechanisms in SRAMs
Author :
Alexander I. Chumakov;Armen V. Sogoyan;Anna B. Boruzdina;Anatoly A. Smolin;Alexander A. Pechenkin
Author_Institution :
Specialized Electron. Syst., Moscow, Russia
Abstract :
New experimental results using both ion and laser facilities are presented to analyse four multiple cell upset (MCU) mechanisms in SRAMs. Equations describing basic MCU mechanisms were provided.
Keywords :
"Scattering","Random access memory","Radiation effects","Integrated circuits","Junctions","Boundary conditions","Writing"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365638
