DocumentCode
3718563
Title
Multiscale Modeling of Accumulation of Radiation Defects in Silicon Detectors under Alpha Particle Irradiation
Author
Mikhail Yu. Romashka;Alexey V. Yanilkin;Alexander I. Titov;Dmitry V. Gusin;Alexey V. Sidelev;Dmitry Yu. Mokeev
Author_Institution
Fed. State Unitary Enterprise “
fYear
2015
Firstpage
1
Lastpage
4
Abstract
A multiscale approach to modeling of accumulation of radiation defects in silicon alpha detectors applied in the associated particle imaging systems is developed. With this approach we calculated the dependencies of defect concentrations and leakage current on time in a detector which was irradiated by alpha particles with energy of 3.5 MeV.
Keywords
"Alpha particles","Radiation effects","Detectors","Silicon","Protons","Nickel","Neutrons"
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN
978-1-5090-0232-0
Type
conf
DOI
10.1109/RADECS.2015.7365639
Filename
7365639
Link To Document