Title :
Multiscale Modeling of Accumulation of Radiation Defects in Silicon Detectors under Alpha Particle Irradiation
Author :
Mikhail Yu. Romashka;Alexey V. Yanilkin;Alexander I. Titov;Dmitry V. Gusin;Alexey V. Sidelev;Dmitry Yu. Mokeev
Author_Institution :
Fed. State Unitary Enterprise “
Abstract :
A multiscale approach to modeling of accumulation of radiation defects in silicon alpha detectors applied in the associated particle imaging systems is developed. With this approach we calculated the dependencies of defect concentrations and leakage current on time in a detector which was irradiated by alpha particles with energy of 3.5 MeV.
Keywords :
"Alpha particles","Radiation effects","Detectors","Silicon","Protons","Nickel","Neutrons"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365639
