• DocumentCode
    3718570
  • Title

    Performance Degradation after Proton Irradiation in Charge-Coupled Devices: A Cross-Device Comparison

  • Author

    Thibaut Prod´homme;Peter Verhoeve;Thierry Beaufort;Sander Bloammert;Bart Butler;Ludovic Duvet;Frederic Lemmel;Hans Smit;Cornelis van der Luijt

  • Author_Institution
    Eur. Space Agency, Noordwijk, Netherlands
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In the context of the technology validation of Charge-Coupled Devices for Euclid and PLATO, two European Space Agency missions dedicated to Astronomy, we present a comparison between the performance degradation (dark current and charge transfer inefficiency) after proton irradiation of two types of device manufactured by e2v.
  • Keywords
    "Temperature measurement","Radiation effects","Protons","Dark current","Charge coupled devices","Performance evaluation","Charge transfer"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365646
  • Filename
    7365646
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718570