Title :
Physical Mechanisms of Radiation Response in Thick Isolation Oxides for Different Temperatures and Dose Rates
Author :
M. G. Drosdetsky;G. I. Zebrev;A. M. Galimov;R. G. Useinov
Author_Institution :
Dept. of Microand Nanoelectron., Nat. Res. Nucl. Univ. “
Abstract :
Temperature behavior of the charge yield and degradation saturation due to the interface precursor depletion has been modeled and simulated. Competition between the time-dependent and true dose rate (ELDRS) effects has been simulated and discussed.
Keywords :
"Annealing","Degradation","Radiation effects","Electric fields","Mathematical model","Temperature dependence","Spontaneous emission"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365648
