Title :
Reliability Analysis of Operating Systems for Embedded SoC
Author :
Thiago Santini;Luigi Carro;Flavio Rech Wagner;Paolo Rech
Author_Institution :
Inst. de Inf., Fed. Univ. of Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
In this paper, we investigate how the presence of a general purpose operating system influences the reliability of modern embedded Systems-on-Chips (SoCs). We experimentally study the difference in the neutron-induced error rate of SoCs when executing the application bare to the metal and on top of the Linux kernel. Our analysis demonstrates that Linux presence barely affects the Silent Data Corruption (SDC) rate while it greatly increases the system Functional Interruption (SEFI) rate (up to 7.48 times) if no preventive measures are taken. Furthermore, we analytically show that cache conflicts between the operating system and application can significantly reduce the Linux-induced SEFI rate increase. Additionally, we evaluate the OS software stack masking effect and show that the higher the abstraction layer in which an application is implemented, the lower its SDC rate.
Keywords :
"Linux","Reliability","Metals","Kernel","Smart phones"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365659