DocumentCode :
3718585
Title :
SEE Laser Testing at Different Temperatures
Author :
Alexander A. Novikov;Alexander A. Pechenkin;Alexander I. Chumakov;Alexey O. Akhmetov;Oleg B. Mavritskii
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI &
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
IC´s single event effects (SEE) sensitivity may depend on temperature. Traditional ion irradiation methods have some limitations, which laser SEE technique can overcome. In this work, SEE laser test results for various temperatures are discussed.
Keywords :
"Temperature sensors","Temperature dependence","Temperature measurement","Radiation effects","Testing","Absorption","Optical sensors"
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
Type :
conf
DOI :
10.1109/RADECS.2015.7365661
Filename :
7365661
Link To Document :
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