Title :
SEL Sensitivity Differences in ICs with Same Crystals Marking
Author :
Alexander A. Pechenkin;Pavel V. Nekrasov;Anna B. Boruzdina;Dmitry E. Protasov
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
Several cases differences SEL sensitivity in IC´s with same crystals marking are presented and discussed. The crystals are compared visually and identical crystal markings confirmed.
Keywords :
"Sensitivity","Radiation effects","Crystals","Ions","Random access memory","Microprocessors","Silicon"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365663
