DocumentCode
3718587
Title
SEL Sensitivity Differences in ICs with Same Crystals Marking
Author
Alexander A. Pechenkin;Pavel V. Nekrasov;Anna B. Boruzdina;Dmitry E. Protasov
Author_Institution
Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
fYear
2015
Firstpage
1
Lastpage
4
Abstract
Several cases differences SEL sensitivity in IC´s with same crystals marking are presented and discussed. The crystals are compared visually and identical crystal markings confirmed.
Keywords
"Sensitivity","Radiation effects","Crystals","Ions","Random access memory","Microprocessors","Silicon"
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN
978-1-5090-0232-0
Type
conf
DOI
10.1109/RADECS.2015.7365663
Filename
7365663
Link To Document